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DTSTART:20070311T020000
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UID:250f1fb9-36e8-430b-8858-8a57b301f7b7.234602@calendar.missouristate.edu
CREATED:20240318T152516Z
LAST-MODIFIED:20240318T152516Z
LOCATION:Kemper Hall 204
SUMMARY:PAMS Seminar: "X-Ray Diffraction Investigation into CVD-Grown van 
 der Waals Films: Disorder and Structure" by David Beckwitt
DESCRIPTION:David Beckwitt (4th-year PhD student in the Department of Phys
 ics and Astronomy)University of Missouri\n\n\nAbstract:\n\n\nVan der Waal
 s (vdW) materials\, characterized by their vertically stacked two-dimensi
 onal (2D) layers\, exhibit unique electronic properties due to the weak v
 dW interactions between the layers. Using x-ray diffraction with an area 
 detector\, we explore vdW thin films of PbI2 grown by chemical vapor depo
 sition (CVD) as well as resultant 2D perovskite films produced by interca
 lating PbI2 films with long chain organic cations. Owing to the weak vdW 
 interaction with the substrate\, the films grow flat on any substrate. Fu
 rthermore\, rotational disorder is observed in the film plane\, giving ri
 se to a 2D powder. This 2D powder manifests as well-defined diffraction s
 pots\, which we have quantitatively modeled. The area detector is particu
 larly effective for observing stacking disorder that is another consequen
 ce of the weak vdW interaction between the layers. The interpretation and
  modeling of the diffraction images will be discussed and represents a br
 oadly useful approach for investigating layered vdW systems which compris
 e a ubiquitous class of materials.
X-ALT-DESC;FMTTYPE=text/html:&lt;html&gt;&lt;head&gt;&lt;title&gt;&lt;/title&gt;&lt;/head&gt;&lt;body&gt;&lt;p&gt;&lt;b
 &gt;David Beckwitt (4th-year PhD student in the Department of Physics and As
 tronomy)&lt;/b&gt;&lt;br&gt;&lt;b&gt;University of Missouri&lt;/b&gt;&lt;/p&gt;\n&lt;p&gt;Abstract:&lt;/p&gt;\n&lt;p&gt;V
 an der Waals (vdW) materials\, characterized by their vertically stacked 
 two-dimensional (2D) layers\, exhibit unique electronic properties due to
  the weak vdW interactions between the layers. Using x-ray diffraction wi
 th an area detector\, we explore vdW thin films of PbI2 grown by chemical
  vapor deposition (CVD) as well as resultant 2D perovskite films produced
  by intercalating PbI2 films with long chain organic cations. Owing to th
 e weak vdW interaction with the substrate\, the films grow flat on any su
 bstrate. Furthermore\, rotational disorder is observed in the film plane\
 , giving rise to a 2D powder. This 2D powder manifests as well-defined di
 ffraction spots\, which we have quantitatively modeled. The area detector
  is particularly effective for observing stacking disorder that is anothe
 r consequence of the weak vdW interaction between the layers. The interpr
 etation and modeling of the diffraction images will be discussed and repr
 esents a broadly useful approach for investigating layered vdW systems wh
 ich comprise a ubiquitous class of materials.&lt;/p&gt;&lt;/body&gt;&lt;/html&gt;
DTSTART;TZID=America/Chicago:20240328T160000
DTEND;TZID=America/Chicago:20240328T170000
SEQUENCE:0
URL:https://physics.missouristate.edu/seminars.htm
CATEGORIES:Public,Alumni,Current Students,Faculty,Future Students,Staff
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