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DTSTART:20070311T020000
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DTSTART:20071104T020000
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UID:a8a9dfc4-f3f2-48dc-9670-ecf91a19dc00.173524@calendar.missouristate.edu
CREATED:20161116T175541Z
LAST-MODIFIED:20161116T175541Z
LOCATION:Kemper Hall 0206
SUMMARY:Research Scientist Clarissa Wisner Presents Seminar
DESCRIPTION:Clarissa Wisner\, senior research Specialist at Missouri Unive
 rsity of Science and Technology (S&amp;T) in Rolla\, MO\, will present a semi
 nar on electron microscopy and related capabilities at the Advanced Mater
 ials Characterization Laboratory (AMCL) at Missouri S&amp;T.\n\n\nThe AMCL wa
 s established in 2001. Current instrumentation includes: high resolution 
 scanning electron microscope (SEM)\, dual-beam Focused Ion Beam (FIB)/SEM
 \, transmission electron microscope (TEM)\, all of which have microanalys
 is capabilities\, two X-ray diffractometers\, atomic force microscope\, X
 -ray photo electron spectrometer\, thermal analysis instruments\, e-beam 
 lithography\, and ancillary sample prep equipment. \n\n\nThe AMCL provide
 s advanced material characterization instrumentation and expertise to S&amp;T
  researchers\, as well as industries nationwide.  To facilitate this miss
 ion\, training and assistance to use the equipment are provided to facult
 y researchers\, graduate and undergraduate students\, post doctorates and
  off campus collaborators by the staff of the AMCL.  
X-ALT-DESC;FMTTYPE=text/html:&lt;html&gt;&lt;head&gt;&lt;title&gt;&lt;/title&gt;&lt;/head&gt;&lt;body&gt;&lt;p cl
 ass="MsoNormal"&gt;&lt;span&gt;Clarissa Wisner\, senior research Specialist at Mis
 souri University of Science and Technology (S&amp;amp\;T) in Rolla\, MO\, wil
 l present a seminar on electron microscopy and related capabilities at th
 e Advanced Materials Characterization Laboratory (AMCL) at Missouri S&amp;amp
 \;T.&lt;/span&gt;&lt;/p&gt;\n&lt;p class="MsoNormal"&gt;The AMCL was established in 2001.&amp;n
 bsp\;Current instrumentation includes: high resolution scanning electron 
 microscope (SEM)\, dual-beam Focused Ion Beam (FIB)/SEM\, transmission el
 ectron microscope (TEM)\, all of which have microanalysis capabilities\, 
 two X-ray diffractometers\, atomic force microscope\, X-ray photo electro
 n spectrometer\, thermal analysis instruments\, e-beam lithography\, and 
 ancillary sample prep equipment&lt;b&gt;.&amp;nbsp\;&lt;/b&gt;&lt;/p&gt;\n&lt;p&gt;The&amp;nbsp\;AMCL&amp;nbs
 p\;provides&amp;nbsp\;advanced material characterization instrumentation and 
 expertise to S&amp;amp\;T researchers\, as well as industries nationwide.&amp;nbs
 p\;&amp;nbsp\;To facilitate this mission\, training and assistance to use the
  equipment are provided to faculty researchers\, graduate and undergradua
 te students\, post doctorates and off campus collaborators by the staff o
 f the AMCL. &amp;nbsp\;&lt;/p&gt;&lt;/body&gt;&lt;/html&gt;
DTSTART;TZID=America/Chicago:20161129T130000
DTEND;TZID=America/Chicago:20161129T140000
SEQUENCE:0
URL:
CATEGORIES:Public,Current Students,Faculty
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